Atomic Force Microscope(afm) - メーカー・企業と製品の一覧

Atomic Force Microscope 'LiteScope 2.0'

Correlation analysis combining SEM and AFM! A deeper understanding of material surfaces.

"LiteScope 2.0" is an atomic force microscope that can be easily integrated with scanning electron microscopes. It can be easily mounted on SEMs and is immediately usable, and it can also be used as a standalone AFM. It is compatible with FIB, GIS, EDS, and other common SEM accessories. 【Features】 ■ Extension of SEM functionality ■ Highly precise correlated imaging ■ Quick and easy alignment to areas of interest ■ Elimination of sample contamination risk ■ Extension of 2D SEM images to 3D *For more details, please refer to the PDF document or feel free to contact us.

• 企業：東陽テクニカ 慶應義塾大学理工学部中央試験所・ 東陽テクニカ産学連携室 ナノイメージングセンター
• 価格：Other

• Electron microscope
• Other microscopes
• Other inspection equipment and devices